Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

CN¥2,549.00

Only 1 left in stock
+ CN¥70.49 Shipping

14-Day Returns Policy

Sold by:

CN¥2,549.00

Only 1 left in stock
+ CN¥70.49 Shipping

14-Day Returns Policy

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Description

Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the
  • Fruugo ID: 344381745-754020938
  • ISBN: 9780415303972

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