Design For Testability Debug And Reliability Next Generation Measures Using F - Sebastian Huhn

CN¥674.00
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Design For Testability Debug And Reliability Next Generation Measures Using F - Sebastian Huhn

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Design For Testability Debug And Reliability Next Generation Measures Using F - Sebastian Huhn

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Design For Testability Debug And Reliability Next Generation Measures Using F - Sebastian Huhn

This Book Introduces Several Novel Approaches To Pave The Way For The Next Generation Of Integrated Circuits, Which Can Be Successfully And Reliably Integrated, Even In Safety-critical Applications.
  • Brand: Unbranded
  • Category: Science, Medicine & Nature
  • Format: Paperback
  • Language: English
  • Publication Date: 2022-04-20
  • Publisher / Label: Springer Nature B.V
  • Author: Sebastian Huhn
  • Number of Pages: 188
  • Fruugo ID: 469764049-983718967
  • ISBN: 9783030692117
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