Quantitative Measurements Of Nano Forces Using Atomic Force Microscopy Afm - Qua

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Quantitative Measurements Of Nano Forces Using Atomic Force Microscopy Afm - Qua

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Quantitative Measurements Of Nano Forces Using Atomic Force Microscopy Afm - Qua

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Quantitative Measurements Of Nano Forces Using Atomic Force Microscopy Afm - Qua

The Atomic Force Microscope (afm) Was Originally Utilised For Its Imaging Capabilities. The Full Potential Of The Afm As A Three-dimensional Force Profiling Instrument Is Only Now Being Realised In An Increasingly Broad Range Of Fields. One Of The Key Requirements For Afm Measurements Is The Quantification Of Both In-plane And Out-of-plane Forces Acting Between The Tip And The Sample.
  • Fruugo ID: 557246231-1125516060
  • ISBN: 9783639024616
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