Reliability Prediction From Burn-in Data Fit To Reliability Models

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+ CN¥149.99 Shipping

Reliability Prediction From Burn-in Data Fit To Reliability Models

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Reliability Prediction From Burn-in Data Fit To Reliability Models

CN¥599.00

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Reliability Prediction From Burn-in Data Fit To Reliability Models

Helps You Educate Chip And System Designers On A Method For Accurately Predicting Circuit And System Reliability In Order To Estimate Failures That Will Occur In The Field As A Function Of Operating Conditions At The Chip Level.
  • Brand: Elsevier Inc
  • Category: Computing & Internet
  • Format: Paperback
  • Language: English
  • Publication Date: 2014-03-07
  • Publisher / Label: Elsevier Inc
  • Author: Joseph Bernstein
  • Number of Pages: 108
  • Fruugo ID: 550905349-1115583303
  • ISBN: 9780128007471
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  • STANDARD: CN¥149.99 - Delivery between Tue 10 November 2026–Tue 08 December 2026

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