Scanning Electron Microscopy And X-ray Microanalysis Third Edition

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Scanning Electron Microscopy And X-ray Microanalysis Third Edition

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Scanning Electron Microscopy And X-ray Microanalysis Third Edition

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Scanning Electron Microscopy And X-ray Microanalysis Third Edition

This Text Provides Students As Well As Practitioners With A Comprehensive Introduction To The Field Of Scanning Electron Microscopy (sem) And X-ray Microanalysis. The Authors Emphasize The Practical Aspects Of The Techniques Described. Topics Discussed Include User-controlled Functions Of Scanning Electron Microscopes And X-ray Spectrometers And The Use Of X-rays For Qualitative And Quantitative Analysis.
  • Brand: Springer Nature B.V
  • Category: Computing & Internet
  • Format: Paperback
  • Language: English
  • Publication Date: 2013-05-31
  • Publisher / Label: Springer Nature B.V
  • Author: Joseph Goldstein
  • Number of Pages: 720
  • Fruugo ID: 557060563-1125329059
  • ISBN: 9781461349693
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