A Unified Approach For Timing Verification And Delay Fault Testing
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A Unified Approach For Timing Verification And Delay Fault Testing
Large System Complexities And Operation Under Tight Timing Constraints In Rapidly Shrinking Technologies Have Made It Extremely Important To Ensure Correct Temporal Behavior Of Modern-day Digital Circuits, Both Before And After Fabrication. Research In (pre-fabrication) Timing Verification And (post-fabrication) Delay Fault Testing Has Evolved Along Largely Disjoint Lines In Spite Of The Fact That They Share Many Basic Concepts. A Unified Approach For Timing Verification And Delay Fault Testing Applies Concepts Developed In The Context Of Delay Fault Testing To Path Sensitization, Which Allows An Accurate Timing Analysis Mechanism To Be Developed.
- 品牌: Springer Nature B.V
- 类别: 计算机与互联网
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语言: English
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作者: Mukund Sivaraman
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出版日期: 1997-11-30
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页数: 176
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出版社／标签: Springer Nature B.V
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格式: Hardcover
- Fruugo ID: 556926203-1125162675
- ISBN: 9780792380795
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