Advanced Materials Characterization Basic Principles Novel Applications An - Ch Sateesh Kumar
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Advanced Materials Characterization Basic Principles Novel Applications An - Ch Sateesh Kumar
The Book Covers Various Methods Of Characterization Of Advanced Materials Commonly In Engineering Including Understanding Of The Working Principle And Applicability Of Devices. Major Instruments Covered Include X-ray Diffraction, Nsom Raman, X-ray Photo Spectroscopy, Uv-vis- Nir Spectrosphotometer, Ftir Spectroscopy, And So Forth.
- 品牌: Unbranded
- 类别: 科学、 医学与自然
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语言: English
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作者: Ch Sateesh Kumar
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出版日期: 2024-11-29
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页数: 144
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出版社／标签: Taylor & Francis Ltd
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格式: Paperback
- Fruugo ID: 435172461-912813409
- ISBN: 9781032375113
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