Defects In Microelectronic Materials And Devices - Taylor & Francis Ltd
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Defects In Microelectronic Materials And Devices - Taylor & Francis Ltd
Focusing Primarily On Silicon-based Microelectronics, Defects In Microelectronic Materials And Devices Provides A Comprehensive Overview Of Recent Progress Made In Understanding The Effects Of Electrically Active Defects In Microelectronic Materials. The Book Places Particular Emphasis On Defects That Limit Device Quality, Reliability, Manufacturability, And Radiation Response. Notable Theorists And Researchers Present Their Perspectives On Defects In Insulators And In Semiconductors As Well As Hydrogen And Defect-related Failure Mechanisms.
- 品牌: Unbranded
- 类别: 科学、 医学与自然
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语言: English
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作者: Taylor & Francis Ltd
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出版日期: 2019-10-07
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页数: 772
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出版社／标签: Taylor & Francis Ltd
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格式: Paperback
- Fruugo ID: 469573579-983527225
- ISBN: 9780367386399
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