High Resolution X-ray Diffractometry And Topography
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High Resolution X-ray Diffractometry And Topography
The Rapid Growth In The Applications Of Electronic Materials Has Created An Increasing Demand For Reliable Techniques For Examining And Characterizing These Materials. This Book Explores The Area Of X-ray Diffraction And The Techniques Available For Deployment In Research, Development, And Production. It Maps The Theoretical And Practical Background Necessary To Study Single Crystal Materials Using High Resolution X-ray Diffraction And Topography.
- 品牌: Taylor & Francis Ltd
- 类别: 计算机与互联网
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语言: English
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作者: D.K. Bowen
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出版日期: 2019-10-10
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页数: 264
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出版社／标签: Taylor & Francis Ltd
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格式: Paperback
- Fruugo ID: 550920494-1115598663
- ISBN: 9780367400637
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