Kelvin Probe Force Microscopy Measuring And Compensating Electrostatic Forces
由……售出:
CN¥1,099.00
有货
+ CN¥150.49 送货
14天退货政策
付款方式：
产品详情
产品详情
Kelvin Probe Force Microscopy Measuring And Compensating Electrostatic Forces
Over The Nearly 20 Years Of Kelvin Probe Force Microscopy, An Increasing Interest In The Technique And Its Applications Has Developed. This Book Gives A Concise Introduction Into The Method And Describes Various Experimental Techniques. Surface Potential Studies On Semiconductor Materials, Nanostructures And Devices Are Described, As Well As Application To Molecular And Organic Materials.
- 品牌: Springer Nature B.V
- 类别: 计算机与互联网
-
语言: English
-
作者: Springer Nature B.V
-
出版日期: 2013-11-30
-
页数: 348
-
出版社／标签: Springer Nature B.V
-
格式: Paperback
- Fruugo ID: 557245871-1125515704
- ISBN: 9783642271137
配送
送货
在 24 小时内发货
-
STANDARD: CN¥150.49 - 之间的交付 周一 09 十一月 2026–周一 07 十二月 2026
从 英国 送货。
退货
退货
我们会争取将您订购的产品按照您的规格完整地配送给您。不过，万一您收到不完整的订单，或收到的产品与您订购的不同，或者有其他原因让您对订单不满意，您可以要求全部或部分退货，您将收到相应产品的全额退款。