Metal Impurities In Silicon-device Fabrication
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Metal Impurities In Silicon-device Fabrication
This Up-to-date Monograph Provides A Thorough Review Of The Relevant Data And Properties Of The Transition-metal Impurities Generated During Silicon-sample And Device Fabrication. The Different Mechanisms Responsible For Contamination Are Discussed, And A Survey Is Given Of Their Impact On Device Performance. The Specific Properties Of The Main And Rare Impurities In Silicon Are Examined, As Well As The Detection Methods And Requirements In Modern Technology.
- 品牌: Springer Nature B.V
- 类别: 计算机与互联网
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语言: English
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作者: Klaus Graff
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出版日期: 2012-10-21
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页数: 294
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出版社／标签: Springer Nature B.V
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格式: Paperback
- Fruugo ID: 557244050-1125513893
- ISBN: 9783642629655
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