Nanometrology Using The Transmission Electron Microscope
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Nanometrology Using The Transmission Electron Microscope
The Transmission Electron Microscope (tem) Is The Ultimate Tool To See And Measure Structures On The Nanoscale And To Probe Their Elemental Composition And Electronic Structure With Sub-nanometer Spatial Resolution. Recent Technological Breakthroughs Have Revolutionized Our Understanding Of Materials Via Use Of The Tem, And It Promises To Become A Significant Tool In Understanding Biological And Biomolecular Systems Such As Viruses And Dna Molecules. This Book Is A Practical Guide For Scientists Who Need To Use The Tem As A Tool To Answer Questions About Physical And Chemical Phenomena On The Nanoscale.
- 品牌: Morgan & Claypool Publishers LLC-IOP
- 类别: 计算机与互联网
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语言: English
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作者: Vlad Stolojan
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出版日期: 2015-10-12
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页数: 70
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出版社／标签: Morgan & Claypool Publishers LLC-IOP
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格式: Hardcover
- Fruugo ID: 557087760-1125356708
- ISBN: 9781643278025
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