Quantitative Measurements Of Nano Forces Using Atomic Force Microscopy Afm - Qua
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Quantitative Measurements Of Nano Forces Using Atomic Force Microscopy Afm - Qua
The Atomic Force Microscope (afm) Was Originally Utilised For Its Imaging Capabilities. The Full Potential Of The Afm As A Three-dimensional Force Profiling Instrument Is Only Now Being Realised In An Increasingly Broad Range Of Fields. One Of The Key Requirements For Afm Measurements Is The Quantification Of Both In-plane And Out-of-plane Forces Acting Between The Tip And The Sample.
- 品牌: KS OmniScriptum Publishing
- 类别: 计算机与互联网
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语言: English
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作者: Gregory Shaun Watson
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出版日期: 2008-06-23
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页数: 176
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出版社／标签: KS OmniScriptum Publishing
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格式: Paperback
- Fruugo ID: 557246231-1125516060
- ISBN: 9783639024616
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