Scanning Electron Microscopy And X-ray Microanalysis Third Edition
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Scanning Electron Microscopy And X-ray Microanalysis Third Edition
This Text Provides Students As Well As Practitioners With A Comprehensive Introduction To The Field Of Scanning Electron Microscopy (sem) And X-ray Microanalysis. The Authors Emphasize The Practical Aspects Of The Techniques Described. Topics Discussed Include User-controlled Functions Of Scanning Electron Microscopes And X-ray Spectrometers And The Use Of X-rays For Qualitative And Quantitative Analysis.
- 品牌: Springer Nature B.V
- 类别: 计算机与互联网
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语言: English
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作者: Joseph Goldstein
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出版日期: 2013-05-31
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页数: 720
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出版社／标签: Springer Nature B.V
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格式: Paperback
- Fruugo ID: 557060563-1125329059
- ISBN: 9781461349693
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